<div dir="ltr"><p class="MsoNormal" align="center" style="font-size:12.8px;text-align:center"><b><u><span lang="ES" style="font-family:Arial,sans-serif">SEMINARIOS  DEL IFLP y DEL DEPARTAMENTO</span></u></b></p><p class="MsoNormal" align="center" style="font-size:12.8px;text-align:center"><b><u><span style="font-family:Arial,sans-serif">MARTES 4 de JULIO – 10:30 hs</span></u></b></p><p class="MsoNormal" align="center" style="font-size:12.8px;text-align:center"><b><u><span lang="EN-US" style="font-family:Arial,sans-serif">AULA CHICA</span></u></b></p><p class="MsoNormal" align="center" style="font-size:12.8px;text-align:center"><b><u><span lang="EN-US" style="font-family:Arial,sans-serif"><br></span></u></b></p><p class="MsoNormal" style="font-size:12.8px"><b><u><span lang="EN-US" style="font-family:Arial,sans-serif">TÍTULO</span></u></b><b><span lang="PT-BR" style="font-family:Arial,sans-serif">: </span></b><b><span lang="EN-US" style="font-family:"Antique Olive",sans-serif">"X-ray absorption spectroscopies to study bulk, surfaces and nanoparticles"</span></b><span lang="PT-BR" style="font-family:Arial,sans-serif;background-image:initial;background-position:initial;background-size:initial;background-repeat:initial;background-origin:initial;background-clip:initial"></span></p><p class="MsoNormal" style="font-size:12.8px;text-align:justify"><span lang="FR"> </span></p><p class="MsoNormal" style="font-size:12.8px;background-image:initial;background-position:initial;background-size:initial;background-repeat:initial;background-origin:initial;background-clip:initial"><span lang="EN-US" style="font-family:Arial,sans-serif;color:rgb(69,69,69)"> </span></p><p class="MsoNormal" style="font-size:12.8px;background-image:initial;background-position:initial;background-size:initial;background-repeat:initial;background-origin:initial;background-clip:initial"><b><u><span lang="EN-US" style="font-family:Arial,sans-serif">EXPOSITOR:</span></u></b><b><span lang="EN-US" style="font-family:Arial,sans-serif"> </span></b><span class="gmail-m_-7778696625263272150gmail-Ninguno"><b><span lang="EN-US">Yves Joly</span></b></span></p><p class="MsoNormal" style="font-size:12.8px;background-image:initial;background-position:initial;background-size:initial;background-repeat:initial;background-origin:initial;background-clip:initial"><i><span lang="PT-BR"><font size="2">Institut Néel, CNRS/Université Grenoble Alpes, Grenoble, France</font></span></i></p><p class="MsoNormal" style="font-size:12.8px"><span lang="PT-BR"> </span></p><p class="MsoNormal" style="font-size:12.8px"><b><u><span lang="EN-US" style="font-family:Arial,sans-serif">Resumen:</span></u></b><span lang="EN-US" style="font-family:Arial,sans-serif"> </span><span lang="PT-BR">After an introduction on X-ray absorption spectroscopy and some of its properties, the purpose is to briefly present the ab initio code, FDMNES, simulating the experimental spectra obtained using this technique. More specifically adapted to the near edge region (XANES), it allows as well, the simulation of related spectroscopies such as X-ray Raman Spectroscopy, Resonant X-ray Diffraction and the Surface Resonant X-ray Diffraction (SRXD).  For XANES, an example of use will be proposed for the study of platinum sub-nanometric particles adsorbed on alumina and, under Hydrogen pressure. In that case, the job was made far easier by the use of the high resolution fluorescence mode to record the experimental spectra. The most recent development on SRXD will give the opportunity to show its potentiality to study thin film and liquid-surface interfaces in electrochemical conditions.</span></p></div>